Researcher
Nathan Ullberg
Persistent identifiers
References for this unit in public registries: they allow cross-checking with other sources and do not change when the name does.
Affiliation
Fields of expertise
Charge density
MoS2
Interference reflection microscopy
stacking
absorbing
transition metal dichalcogenides
Backside
transistors
5 publications in HAL since 2022.
Data provenance
Sources : scanR, HAL. Data compiled on 27/10/2026. Found an error? It is corrected in the original source (HAL, RNSR, directory); see how.