Researcher
Ali Ibrahim
Persistent identifiers
References for this unit in public registries: they allow cross-checking with other sources and do not change when the name does.
Affiliation
Fields of expertise
Power Cycling
metallization
Crack propagation
MOSFET
power module
topside
junction temperature
onion
13 publications in HAL since 2022.
Data provenance
Sources : scanR, HAL. Data compiled on 27/10/2026. Found an error? It is corrected in the original source (HAL, RNSR, directory); see how.